Please use this identifier to cite or link to this item:
http://dspace2020.uniten.edu.my:8080/handle/123456789/9341Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hock, G.C. | |
| dc.contributor.author | Chakrabarty, C.K. | |
| dc.contributor.author | Badjian, M.H. | |
| dc.contributor.author | Devkumar, S. | |
| dc.contributor.author | Emilliano | |
| dc.date.accessioned | 2018-02-23T06:50:23Z | - |
| dc.date.available | 2018-02-23T06:50:23Z | - |
| dc.date.issued | 2008 | |
| dc.identifier.uri | http://dspace.uniten.edu.my/jspui/handle/123456789/9341 | - |
| dc.description.abstract | This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE. | |
| dc.title | Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material | |
| item.fulltext | No Fulltext | - |
| item.grantfulltext | none | - |
| Appears in Collections: | COE Scholarly Publication | |
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.