Please use this identifier to cite or link to this item: http://dspace2020.uniten.edu.my:8080/handle/123456789/8796
Title: Study on reliability test of die attach material
Authors: Yik, L.C.
Kar, Y.B.
Shafika, N.
Issue Date: 2012
Abstract: Silver plated copper is a new developed die attachment material to replace pure silver. As year past, price of silver getting higher and become a problem for those semiconductors packaging company. Therefore, silver plated copper was developed as new die attachment material to solve the costing problem. But the characteristic and reliability of silver plated copper filler has be a doubt to replace the pure silver in the market. This paper will review few test method to test on the reliability of silver plated copper filler and proved that it is as good as silver to be the filler. © 2012 IEEE.
URI: http://dspace.uniten.edu.my/jspui/handle/123456789/8796
Appears in Collections:COE Scholarly Publication

Show full item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.