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http://dspace2020.uniten.edu.my:8080/handle/123456789/8704| Title: | Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation | Authors: | Mills, B. Chau, C.F. Rogers, E.T.F. Grant-Jacob, J. Stebbings, S.L. Praeger, M. De Paula, A.M. Froud, C.A. Chapman, R.T. Butcher, T.J. Brocklesby, W.S. Frey, J.G. |
Issue Date: | 2009 | Abstract: | XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres. © 2009 OSA. | URI: | http://dspace.uniten.edu.my/jspui/handle/123456789/8704 |
| Appears in Collections: | COE Scholarly Publication |
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