Please use this identifier to cite or link to this item: http://dspace2020.uniten.edu.my:8080/handle/123456789/5743
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dc.contributor.authorHock, G.C.en_US
dc.contributor.authorChakrabarty, C.K.en_US
dc.contributor.authorBadjian, M.H.en_US
dc.contributor.authorDevkumar, S.en_US
dc.contributor.authorEmillianoen_US
dc.date.accessioned2017-12-08T06:45:49Z-
dc.date.available2017-12-08T06:45:49Z-
dc.date.issued2008-
dc.description.abstractThis paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE.en_US
dc.language.isoen_USen_US
dc.relation.ispartof2008 IEEE International RF and Microwave Conference, RFM 2008 2008, Article number 4897416, Pages 167-170en_US
dc.titleSuper-heterodyne interferometer for non-contact dielectric measurements on millimeter wave materialen_US
dc.typeConference Paperen_US
dc.identifier.doi10.1109/RFM.2008.4897416-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.openairetypeConference Paper-
Appears in Collections:COE Scholarly Publication
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