Browsing by Author Kar, Y.B.

Showing results 1 to 15 of 20
Issue DateTitleAuthor(s)
2010Charge transport of novel blue dibenzothiophene phenylenediamine copolymerKar, Y.B. ; Abdullah, S.F. ; Chou, Y.T. ; Kok, H.C. 
2013Comparison study on reliability performance for polymer core solder balls under multiple reflow and HTS stress testsKar, Y.B. ; Hui, T.C. ; Agileswari, R. ; Lo, C. 
2013Comparison study on shear strength and intermetallic compound for SAC and polymer core solder ballsKar, Y.B. ; Agileswari ; Hui, T.C. ; Talik, N.A. 
2012Development of insulated Cu wire ball bondingLeong, H.Y. ; Mohd, F.Z. ; Ibrahim, M.R. ; Kid, W.B. ; Khan, N. ; Kar, Y.B. ; Tan, L.C. 
2010Electrical stability of PLEDsKar, Y.B. ; Bradley, D. 
2013Finite element analysis of thermal distributions of solder ball in flip chip ball grid array using ABAQUSKar, Y.B. ; Talik, N.A. ; Sauli, Z. ; Fei, J.S. ; Retnasamy, V. 
2012Flux residue cleaning process optimization effect on Flip Chip Ball Grid Array reliabilityKar, Y.B. ; Tahk, N.A. ; Seng, F.C. ; Yang, L.H. ; Vithyacharan, R. ; Yong, T.C. 
2011Improvement of Cu-Al bond integrity on low k pad structuresKid, W.B. ; Leng, E.P. ; Yong, C.C. ; Yi, O.X. ; Kar, Y.B. 
2013Ionic contaminations level and cleaning flip chip BGA package via a new cleaning solvent technologyKar, Y.B. ; Talik, N.A. ; Sauli, Z. ; Seng, F.C. ; Yong, T.C. ; Retnasamy, V. 
2011Metallurgical bond integrity of C45 ultra fine pitch with 18m copper wireKid, W.B. ; Leng, E.P. ; Seong, L.B. ; Weily, C. ; Kar, Y.B. 
2015Multi beam laser grooving process parameter development and die strength characterization for 40nm node low-K/ULK waferShi, K.W. ; Yow, K.Y. ; Lo, C. ; Kar, Y.B. ; Misran, H. 
2012Solder ball robustness study on polymer core solder balls for BGA packagesKar, Y.B. ; Hui, T.C. ; Agileswari ; Lo, C. 
2012Study on reliability test of die attach materialYik, L.C. ; Kar, Y.B. ; Shafika, N. 
2016The effects of zinc oxide on the sinterability of hydroxyapatiteChing, T.Y. ; Singh, R. ; Yong, T.C. ; Kar, Y.B. 
2017Ultraviolet Laser Diode Ablation Process for CMOS 45 nm Copper Low-K Semiconductor WaferShi, K.W. ; Kar, Y.B. ; Talik, N.A. ; Yew, L.W.