Browsing by Author Zaharim, A.


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Issue DateTitleAuthor(s)
2010Analyze and optimize the silicide thickness in 45nm CMOS technology using Taguchi methodSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Analyze of input process parameter variation on threshold voltage in 45nm n-channel MOSFETSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Elgomati, H.A. ; Majlis, B.Y. 
2011Application of Taguchi method in the optimization of process variation for 32nm CMOS technologyElgomati, H.A. ; Majlis, B.Y. ; Ahmad, I. ; Salehuddin, F. ; Hamid, F.A. ; Zaharim, A. ; Apte, P.R. 
2010Characterization and optimizations of silicide thickness in 45nm pMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Cobalt silicide and titanium silicide effects on nano devicesElgomati, H.A. ; Majlis, B.Y. ; Salehuddin, F. ; Ahmad, I. ; Zaharim, A. ; Hamid, F.A. 
2006Effect of moisture on underfill interfacial adhesion and packages flexural strength in flip chip packagingEndut, Z. ; Ahmad, I. ; Zaharim, A. ; Sukemi, N.M. 
2010Effect of process parameter variations on threshold voltage in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Effects of different catalytic activation techniques on the thermal performance of flip chip heat spreaderLim, V. ; Amin, N. ; Foong, C.S. ; Ahmad, I. ; Zaharim, A. ; Rasid, R. ; Jalar, A. 
2011Employability skills for an entry-level engineer as seen by Malaysian employersYuzainee, M.Y. ; Zaharim, A. ; Omar, M.Z. 
2009Employability skills framework for engineering graduate in MalaysiaZaharim, A. ; Yusoff, Y.M.D. ; Omar, M.Z. ; Basri, H. 
2012Employability skills performance score for fresh engineering graduates in Malaysian industryMd Yusoff, Y. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. 
2009Employers' selection skills in recruiting fresh engineering graduatesMd Yusoff, Y. ; Zaharim, A. ; Omar, M.Z. ; Mohamed, A. ; Muhamad, N. ; Mustafa, R. 
2013Employment preference for university of fresh engineering graduatesYuzainee, M.Y. ; Rahmat, R.A.O.K. ; Zaharim, A. 
2010Enhancing employability skills through industrial training programmeYusoff, Y.M. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. ; Mustapha, R. 
2012Impact of different dose and angle in HALO structure for 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2010Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Optimization of HALO structure effects in 45nm p-type MOSFETs device using taguchi methodSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Elgomati, H.A. ; Majlis, B.Y. ; Apte, P.R. 
2011Optimization of input process parameters variation on threshold voltage in 45 nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Hashim, U. ; Apte, P.R. 
2011Optimization of process parameter variability in 45 nm PMOS device using Taguchi methodSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
Showing results 1 to 20 of 28  next >